DocumentCode
2901812
Title
Integration of high quality top-gated graphene field effect devices on 150 mm substrate
Author
Heo, Jinseong ; Chung, Hyun-Jong ; Lee, Sung-Hoon ; Yang, Heejun ; Shin, Jaikwang ; Chung, U-in ; Seo, Sunae
Author_Institution
Semicond. Device Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
fYear
2011
fDate
20-22 June 2011
Firstpage
31
Lastpage
32
Abstract
Recent success of inexpensive and high-throughput chemical vapor deposition (CVD) growth of graphene on Ni or Cu substrates has shown promises for potential industrial applications such as transparent electrodes and field effect transistors (FET). However, high-coverage uniform growth of monolayer graphene on a wafer scale is still a major obstruction, which impedes high yield integration of high performance field effect devices. In this paper, the authors report the first demonstration of high quality top-gated graphene field effect devices on 150 mm substrates exploiting unprecedented homogeneous CVD growth of monolayer graphene.
Keywords
CVD coatings; etching; field effect devices; graphene; C; chemical vapor deposition growth; high coverage uniform growth; high yield integration; monolayer graphene; size 150 mm; top gated graphene field effect device; wafer scale; Logic gates; Microscopy; Optical microscopy; Plasmas; Resistance; Substrates; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2011 69th Annual
Conference_Location
Santa Barbara, CA
ISSN
1548-3770
Print_ISBN
978-1-61284-243-1
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2011.5994407
Filename
5994407
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