• DocumentCode
    2901812
  • Title

    Integration of high quality top-gated graphene field effect devices on 150 mm substrate

  • Author

    Heo, Jinseong ; Chung, Hyun-Jong ; Lee, Sung-Hoon ; Yang, Heejun ; Shin, Jaikwang ; Chung, U-in ; Seo, Sunae

  • Author_Institution
    Semicond. Device Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
  • fYear
    2011
  • fDate
    20-22 June 2011
  • Firstpage
    31
  • Lastpage
    32
  • Abstract
    Recent success of inexpensive and high-throughput chemical vapor deposition (CVD) growth of graphene on Ni or Cu substrates has shown promises for potential industrial applications such as transparent electrodes and field effect transistors (FET). However, high-coverage uniform growth of monolayer graphene on a wafer scale is still a major obstruction, which impedes high yield integration of high performance field effect devices. In this paper, the authors report the first demonstration of high quality top-gated graphene field effect devices on 150 mm substrates exploiting unprecedented homogeneous CVD growth of monolayer graphene.
  • Keywords
    CVD coatings; etching; field effect devices; graphene; C; chemical vapor deposition growth; high coverage uniform growth; high yield integration; monolayer graphene; size 150 mm; top gated graphene field effect device; wafer scale; Logic gates; Microscopy; Optical microscopy; Plasmas; Resistance; Substrates; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2011 69th Annual
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-61284-243-1
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2011.5994407
  • Filename
    5994407