• DocumentCode
    2901820
  • Title

    Demountable testing of beam focusing by electrostatic fields

  • Author

    Kumar, Meda Vinay ; Geetha, M.K. ; Agrawal, A.K. ; Raina, Sushil ; Kumar, Lalit

  • Author_Institution
    Microwave Tube R&D Centre, Bangalore, India
  • fYear
    2011
  • fDate
    21-24 Feb. 2011
  • Firstpage
    197
  • Lastpage
    198
  • Abstract
    This paper describes the design and experimentation of electrostatic focusing of electron beam using a demountable vacuum measurement setup. Initially a focusing setup is designed for focusing a single on-axis low perveance beam. The design was carried out using an in house developed 2.5 D finite difference electron optics code PIERCE and CST Particle Studio. This focusing scheme is being extended for multiple beams of same perveance for a compact klystron device.
  • Keywords
    electric fields; electron beam focusing; electron beam testing; electron guns; electron optics; finite difference methods; klystrons; vacuum measurement; CST particle studio; PIERCE particle studio; beam focusing demountable testing; demountable vacuum measurement setup; electron beam; electron gun; electrostatic field; electrostatic focusing; finite difference electron optics code; klystron device; perveance beam; Cathodes; Electric potential; Electrostatics; Focusing; Lenses; Particle beams; Electron guns; Electron optics; Electrostatics; Focusing; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2011 IEEE International
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8662-5
  • Type

    conf

  • DOI
    10.1109/IVEC.2011.5746943
  • Filename
    5746943