• DocumentCode
    2902786
  • Title

    Chip-To-Chip Interconnection by Mechanical Caulking Using Reflowed Sn Bumps

  • Author

    Yang, Ju-heon ; Kim, Young-Ho ; Moon, Jae-Seung ; Lee, Won-Jong

  • Author_Institution
    Hanyang Univ., Seoul
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A new chip-to-chip interconnection method utilizing mechanical caulking has been developed recently. In this method, bonding between the chips is achieved by deformation-injection of Au stud bump on a chip into the through via hole in the other chip. In this paper, we introduce a modified caulking technology using reflowed Sn bumps instead Au stud bumps since Sn can be deformed more easily than Au. The chip-to-chip interconnection using reflowed Sn bumps and through via hole electrodes was successfully made at room temperature or at 270degC. The contact resistance of the solder joint was less than 35 mOmega per joint.
  • Keywords
    integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; reflow soldering; sealing materials; tin; Sn; chip bonding; chip-to-chip interconnection; contact resistance; deformation-injection; hole electrodes; mechanical caulking; reflowed tin bumps; solder joint; temperature 270 C; temperature 293 K to 298 K; three-dimensional packaging technology; Bonding; Electrodes; Gold; Materials science and technology; Packaging; Sputter etching; Sputtering; Temperature; Tin; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441380
  • Filename
    4441380