• DocumentCode
    2904101
  • Title

    Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition

  • Author

    Lee, Jinkyu ; Touba, Nur A.

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX
  • fYear
    2006
  • fDate
    20-23 Nov. 2006
  • Firstpage
    237
  • Lastpage
    244
  • Abstract
    Previous approaches for utilizing ATE vector repeat are based on identifying runs of repeated scan data and directly generating that data using ATE vector repeat. Each run requires a separate vector repeat instruction, so the amount of compression is limited by the amount of ATE instruction memory available and the length of the runs (which typically will be much shorter than the length of a scan vector). In this paper a new and more efficient approach is proposed for utilizing ATE vector repeat. The scan vector sequence is partitioned and decomposed into a common sequence which is the same for an entire cluster of test cubes and a unique sequence that is different for each test cube. The common sequence can be generated very efficiently using ATE vector repeat. Experimental results demonstrate that the proposed approach can achieve much greater compression while using many fewer vector repeat instructions compared with previous methods
  • Keywords
    automatic test equipment; automatic test pattern generation; boundary scan testing; circuit testing; ATE vector repeat; instruction memory; scan vector decomposition; vector repeat instruction; Automatic test pattern generation; Automatic testing; Clocks; Data engineering; Decoding; Encoding; Fault detection; Pins; Test equipment; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.261026
  • Filename
    4030774