• DocumentCode
    2904865
  • Title

    Closed-Form Path-Loss Predictor for Gaussianly Distributed Nodes

  • Author

    Abdulla, Mouhamed ; Shayan, Yousef R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montréal, QC, Canada
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The emulation of wireless nodes spatial position is a practice used by deployment engineers and network planners to analyze the characteristics of a network. In particular, nodes geolocation will directly impact factors such as connectivity, signals fidelity, and service quality. In literature, in addition to typical homogenous scattering, normal distribution is frequently used to model mobiles concentration in a cellular system. Moreover, Gaussian dropping is often considered as an effective placement method for airborne sensor deployment. Despite the practicality of this model, getting the network channel loss distribution still relies on exhaustive Monte Carlo simulation. In this paper, we argue the need for this inefficient approach and hence derived a generic and exact closed-form expression for the path-loss distribution density between a base-station and a network of nodes. Simulation was used to reaffirm the validity of the theoretical analysis using values from the new IEEE 802.20 standard.
  • Keywords
    Monte Carlo methods; normal distribution; sensor placement; Gaussianly distributed nodes; IEEE 802.20 standard; Monte Carlo simulation; airborne sensor deployment; cellular system; closed form path loss predictor; homogenous scattering; network channel loss distribution; normal distribution; path loss distribution density; service quality; signal fidelity; Communications Society; Emulation; Gaussian distribution; Global Positioning System; Humans; Peer to peer computing; Scattering; Stochastic processes; Surface topography; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (ICC), 2010 IEEE International Conference on
  • Conference_Location
    Cape Town
  • ISSN
    1550-3607
  • Print_ISBN
    978-1-4244-6402-9
  • Type

    conf

  • DOI
    10.1109/ICC.2010.5502200
  • Filename
    5502200