• DocumentCode
    2905845
  • Title

    Eef Bagerman [biography]

  • Author

    Bagerman, Eef

  • Author_Institution
    Senior. Director IMO-Backend Innovation, NXP Semiconductors, IC Manufacturing Operations (IMO), Gerstweg 2, 6534 AE Nijmegen. Tel: +31 243532133 / 3085, Email: eef.bagerman@nxp.com
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given, as follows. A short biography of Eef Bagerman is presented. Dr Bagerman studied organic chemistry, where after he spent 2 years in Research in a pharmaceutical company called \´Gist Brocades\´, before joining Philips in 1979. The first 8 years in Philips in development and engineering of magnetic tapes for application in audio and video equipment in a joint venture (JV) of Philips and Dupont. In 1987 he joint Philips Semiconductors in various development functions in the \´back-end\´ (assembly): package development, material and technology development. He was assigned in 1997 to set up and manage the worldwide Innovation Department of the Assembly and Test Organization (ATO) of Philips Semiconductors with departments in San Jose, Nijmegen, Kaohsiung, Caen, Bangkok and Manila, total about 250 people. Since early 2005 Philips Semiconductors has integrated its wafer fab, test and assembly manufacturing organization into one IC Manufacturing Operations (IMO), including the innovation activities which creates huge opportunities for wafer fab and assembly technology integration ("Mid end" innovation). The current technical focus is aimed at miniaturization and system-in-package (SiP) in various technologies and its industrialization. Since October 2006 the semiconductor business was split-off of Philips and NXP was born.
  • Keywords
    Biographies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1391-1
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441556
  • Filename
    4441556