DocumentCode
2906318
Title
21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems - Title
fYear
2006
fDate
4-6 Oct. 2006
Abstract
The following topics are dealt with: VLSI system; defect tolerance; error correction; reliability evaluation and analysis; fault tolerant designs; test and diagnosis; soft errors; test compression; processor checking and jitter
Keywords
VLSI; built-in self test; fault diagnosis; integrated circuit testing; jitter; logic circuits; logic testing; reliability; VLSI system; circuit jitter; defect tolerance; error correction; fault diagnosis; fault tolerant designs; processor checking; reliability analysis; reliability evaluation; soft errors; test compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location
Arlington, VA
ISSN
1550-5774
Print_ISBN
0-7695-2706-X
Type
conf
DOI
10.1109/DFT.2006.3
Filename
4030906
Link To Document