• DocumentCode
    2906505
  • Title

    Error Tolerance of DNA Self-Assembly by Monomer Concentration Control

  • Author

    Jang, Byunghyun ; Kim, Yong-Bin ; Lombardi, Fabrizio

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
  • fYear
    2006
  • fDate
    4-6 Oct. 2006
  • Firstpage
    89
  • Lastpage
    97
  • Abstract
    This paper proposes the control of monomer concentration as a novel improvement of the kinetic tile assembly model (kTAM) to reduce the error rate in DNA self-assembly. Tolerance to errors in this process is very important for manufacturing highly dense ICs; the proposed technique significantly decreases error rates (i.e. it increases error tolerance) by controlling the concentration of monomers. A stochastic analysis based on a new state model is presented. Error rates reductions of at least 10% are found by evaluating the proposed scheme comparing to a scheme with constant concentration. One of the significant advantages of the proposed scheme is that it doesn´t entail an overhead such as increase in size and a slow growth, while still achieving a significant reduction in error rate
  • Keywords
    DNA; biomolecular electronics; errors; integrated circuit design; molecules; nanotechnology; self-assembly; stochastic processes; DNA self-assembly; IC manufacturing; error rates reductions; error tolerance; kinetic tile assembly model; monomer concentration control; stochastic analysis; Assembly; Computer errors; DNA; Error analysis; Error correction; Kinetic theory; Manufacturing processes; Self-assembly; Stochastic processes; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2706-X
  • Type

    conf

  • DOI
    10.1109/DFT.2006.29
  • Filename
    4030919