DocumentCode
2906652
Title
Modified Triple Modular Redundancy Structure based on Asynchronous Circuit Technique
Author
Rui, GONG ; Wei, CHEN ; Fang, LIU ; Kui, DAI ; Zhiying, Wang
Author_Institution
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha
fYear
2006
fDate
Oct. 2006
Firstpage
184
Lastpage
196
Abstract
Two modified triple modular redundancy (TMR) structures based on asynchronous circuit technique are proposed in this paper. Double modular redundancy (DMR) structure uses asynchronous C element to output and keep the correct value of two redundant storage cells. Temporal spatial triple modular redundancy structure with DCTREG (TSTMR-D) uses explicit separated master and slave latch structure of de-synchronous pipeline. Three soft error tolerant 8051 cores with DMR, TMR and TSTMR-D respectively are implemented in SMIC 0.35mum process. Fault injection experiments are also included. The experiment results indicate that DMR structure has a relatively low overhead on both area and latency than TMR, while tolerances SEUs in sequential logic. TSTMR-D structures can tolerance soft errors in both sequential logic and combinational logic with reasonable area and latency overhead
Keywords
asynchronous circuits; combinatorial mathematics; fault tolerance; flip-flops; redundancy; 8051 cores; DCTREG; SEU; SMIC; TSTMR-D; asynchronous C element; asynchronous circuit; combinational logic; double modular redundancy structure; fault injection; master and slave latch structure; sequential logic; soft error tolerant; temporal spatial triple modular redundancy structure; Asynchronous circuits; Circuit faults; Delay; Flip-flops; Latches; Logic devices; Pipelines; Protection; Redundancy; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location
Arlington, VA
ISSN
1550-5774
Print_ISBN
0-7695-2706-X
Type
conf
DOI
10.1109/DFT.2006.44
Filename
4030929
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