• DocumentCode
    2906652
  • Title

    Modified Triple Modular Redundancy Structure based on Asynchronous Circuit Technique

  • Author

    Rui, GONG ; Wei, CHEN ; Fang, LIU ; Kui, DAI ; Zhiying, Wang

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    184
  • Lastpage
    196
  • Abstract
    Two modified triple modular redundancy (TMR) structures based on asynchronous circuit technique are proposed in this paper. Double modular redundancy (DMR) structure uses asynchronous C element to output and keep the correct value of two redundant storage cells. Temporal spatial triple modular redundancy structure with DCTREG (TSTMR-D) uses explicit separated master and slave latch structure of de-synchronous pipeline. Three soft error tolerant 8051 cores with DMR, TMR and TSTMR-D respectively are implemented in SMIC 0.35mum process. Fault injection experiments are also included. The experiment results indicate that DMR structure has a relatively low overhead on both area and latency than TMR, while tolerances SEUs in sequential logic. TSTMR-D structures can tolerance soft errors in both sequential logic and combinational logic with reasonable area and latency overhead
  • Keywords
    asynchronous circuits; combinatorial mathematics; fault tolerance; flip-flops; redundancy; 8051 cores; DCTREG; SEU; SMIC; TSTMR-D; asynchronous C element; asynchronous circuit; combinational logic; double modular redundancy structure; fault injection; master and slave latch structure; sequential logic; soft error tolerant; temporal spatial triple modular redundancy structure; Asynchronous circuits; Circuit faults; Delay; Flip-flops; Latches; Logic devices; Pipelines; Protection; Redundancy; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2706-X
  • Type

    conf

  • DOI
    10.1109/DFT.2006.44
  • Filename
    4030929