DocumentCode
2906875
Title
Enhancing observability of signal composition response and error signatures during dynamic SEE analog to digital device testing
Author
Berg, M. ; Buchner, S. ; Kim, H. ; Friendlich, M. ; Perez, C. ; Phan, A. ; Seidleck, C. ; LaBel, K.
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
313
Lastpage
316
Abstract
A novel method of dynamic SEE ADC testing is presented. The approach utilizes a FPGA core for processing and has proven to enhance error signature and signal integrity observation verses alternate techniques.
Keywords
analogue-digital conversion; field programmable gate arrays; integrated circuit testing; FPGA core; dynamic SEE ADC device testing; dynamic SEE analog to digital conversion device testing; error signature enhancement; signal composition response; signal integrity observation; Clocks; Filtration; Noise; Radiation effects; Signal generators; Synchronization; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location
Bruges
ISSN
0379-6566
Print_ISBN
978-1-4577-0492-5
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2009.5994666
Filename
5994666
Link To Document