Equivalent IDDQ Tests for Systems with Regulated Power Supply

Author

Chen, Chuen-Song ; Lo, Jien-Chung ; Xia, Tian

Author_Institution

Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI

fYear

2006

fDate

Oct. 2006

Firstpage

291

Lastpage

299

Abstract

This paper presents an equivalent current sensing technique for the applications o tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the I_DDQ information. Equivalent I_DDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. I_DDQ based test methods are used to post-process those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18mum CMOS technology

Keywords

CMOS integrated circuits; IEEE standards; integrated circuit testing; voltage regulators; 0.18 micron; CMOS technology; IEEE 1149.1 standard; equivalent current sensing technique; internal voltage signal measurement; on-chip voltage regulators; CMOS technology; Circuit testing; Degradation; Electrical resistance measurement; Integrated circuit testing; Power engineering computing; Power supplies; Regulators; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on

Conference_Location

Arlington, VA

ISSN

1550-5774

Print_ISBN

0-7695-2706-X

Type

conf

DOI

10.1109/DFT.2006.28

Filename

4030940