DocumentCode
2906955
Title
Experimental Analysis of Clipping and Filtering Effects on OFDM Systems
Author
Lee, Taewoo ; Ochiai, Hideki
Author_Institution
Grad. Sch. of Eng., Yokohama Nat. Univ., Yokohama, Japan
fYear
2010
fDate
23-27 May 2010
Firstpage
1
Lastpage
5
Abstract
Orthogonal frequency division multiplexing (OFDM) has an advantage of high bandwidth efficiency, but it suffers from high peak-to-average power ratio (PAPR) which causes severe nonlinear distortion in actual devices such as power amplifiers. Several techniques have been proposed in order to reduce PAPR. Among them, clipping and filtering (CAF) is considered attractive due to its simple structure. The CAF can reduce nonlinear distortion in analog devices and as a result out-of-band radiation is reduced. However, it causes the so-called in-band distortion and thus increases signal distortion or error vector magnitude (EVM). In this paper, we analyze the effects of the CAF on the OFDM system through experiment using a real power amplifier. By adjusting the input back-off (IBO) of the power amplifier, we evaluate the increase of the received power for a given EVM and sidelobe level of power spectra that may contribute to adjacent channel interference (ACI). It is shown that by appropriately adjusting the IBO and clipping ratio, the received power can be improved by several dB while maintaining the amount of ACI for a given EVM.
Keywords
OFDM modulation; error analysis; filtering theory; interference (signal); nonlinear distortion; power amplifiers; radio networks; OFDM systems; adjacent channel interference; clipping effects; error vector magnitude; filtering effects; nonlinear distortion; orthogonal frequency division multiplexing; out-of-band radiation; peak-to-average power ratio; power amplifier; Band pass filters; Discrete Fourier transforms; Filtering; Interchannel interference; Nonlinear distortion; OFDM; Peak to average power ratio; Power amplifiers; Signal generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications (ICC), 2010 IEEE International Conference on
Conference_Location
Cape Town
ISSN
1550-3607
Print_ISBN
978-1-4244-6402-9
Type
conf
DOI
10.1109/ICC.2010.5502316
Filename
5502316
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