• DocumentCode
    2908913
  • Title

    Novel equipment for the measurement of core losses in laminations for advanced machines

  • Author

    Ibrahim, Maged ; Pillay, Pragasen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    1231
  • Lastpage
    1236
  • Abstract
    This paper presents a novel state of the art equipment for core loss measurements under high frequency and non-sinusoidal excitations. Sinusoidal high frequency measurements are performed using a commercial test system especially designed for high frequency testing. Comparative measurements are performed over a wide range of frequencies using the three standardized testers; Epstein frame, toroid tester and single sheet tester. Discrepancies in the results obtained from the three testers are shown and analyzed. A test bench is also developed to carry out core loss measurements under non-sinusoidal excitations. Specific core losses at different parts of a permanent magnet motor are predicted by generating the motor flux waveforms in motor laminations using the Epstein frame. The results show a significant increase in the specific core loss in the stator tooth of the machine.
  • Keywords
    laminations; loss measurement; losses; machine testing; magnetic cores; permanent magnet motors; stators; test equipment; Epstein frame; advanced machine lamination; commercial test system; core loss measurement; high frequency excitation; high frequency testing; motor flux waveform; nonsinusoidal excitation; permanent magnet motor; single sheet tester; sinusoidal high frequency measurement; stator tooth; test bench; toroid tester; Core loss; Current measurement; Frequency measurement; Lamination; Loss measurement; Magnetic hysteresis; Testing; Core loss; Epstein frame; Single sheet tester; Toroid tester; permanent magnet motor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Machines & Drives Conference (IEMDC), 2011 IEEE International
  • Conference_Location
    Niagara Falls, ON
  • Print_ISBN
    978-1-4577-0060-6
  • Type

    conf

  • DOI
    10.1109/IEMDC.2011.5994779
  • Filename
    5994779