A Two-Pass Diagnosis Method for Accurately Locating Logic Faults in VLSI Circuits

In this paper, we present a two-pass approach for digital circuit fault diagnosis. By using the two-pass diagnosis method we can significantly improve the logic fault diagnostic resolution while keeping the test cost manageable. We performed fault diagnostic simulations on dozens of ISCAS89, ITC99, and other benchmark circuits and we are able to narrow down the list of likely faults to a single fault or multiple equivalent faults that are indistinguishable from each other.