• DocumentCode
    2909240
  • Title

    Radiation Damage Analysis of a commercial optical CMOS Image Sensor

  • Author

    Vodnala, Preeti ; Haji-Sheikh, Micheal ; Lurio, Lawrence

  • Author_Institution
    Northern Illinois Univ., DeKalb
  • fYear
    2007
  • fDate
    1-3 May 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Detectors used with an intense radiation source, such as synchrotron require the need to study the damage which has occurred to the detector. This paper concentrates on understanding the effect of radiation damage on signal quality and examines a method to reduce such a damage.
  • Keywords
    CMOS image sensors; radiation detection; radiation effects; intense radiation source; optical CMOS image sensor; radiation damage analysis; signal quality; synchrotron; CMOS image sensors; Cameras; Clocks; Dark current; Image analysis; Optical sensors; Radiation detectors; Synchrotron radiation; Temperature; X-ray detection; CMOS image sensor; XPCS; dark current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
  • Conference_Location
    Warsaw
  • ISSN
    1091-5281
  • Print_ISBN
    1-4244-0588-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2007.379023
  • Filename
    4258124
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2909240