• DocumentCode
    2911180
  • Title

    Advanced analysis techniques for cross-product coverage

  • Author

    Azatchi, Hezi ; Fournier, Laurent ; Ziv, Avi ; Zohar, Keren

  • Author_Institution
    IBM Res. Lab. in Haifa, Israel
  • fYear
    2005
  • fDate
    30 Nov.-2 Dec. 2005
  • Firstpage
    229
  • Lastpage
    236
  • Abstract
    Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequately tested. Because of their sheer size, the analysis of large coverage models can be an intimidating and time-consuming task. This paper presents two new techniques for coverage analysis. The first technique, coverage query, allows users that concentrate on a single uncovered event to find larger phenomena (e.g., hole) that contains this event. The second technique, quasi-hole analysis, automatically identifies large areas in the coverage space that are lightly covered. The proposed techniques provide additional means for extracting relevant, useful information, thereby improving the quality of the coverage analysis. A number of examples are provided showing how the proposed method improved the verification of actual designs.
  • Keywords
    integrated circuit layout; integrated circuit testing; microprocessor chips; advanced analysis; coverage analysis; coverage query; coverage tools; cross-product coverage; quasi-hole analysis; verification process; Cost benefit analysis; Data analysis; Data mining; Information analysis; Investments; Laboratories; Monitoring; Process design; Risk analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
  • ISSN
    1552-6674
  • Print_ISBN
    0-7803-9571-9
  • Type

    conf

  • DOI
    10.1109/HLDVT.2005.1568842
  • Filename
    1568842