DocumentCode
2911180
Title
Advanced analysis techniques for cross-product coverage
Author
Azatchi, Hezi ; Fournier, Laurent ; Ziv, Avi ; Zohar, Keren
Author_Institution
IBM Res. Lab. in Haifa, Israel
fYear
2005
fDate
30 Nov.-2 Dec. 2005
Firstpage
229
Lastpage
236
Abstract
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequately tested. Because of their sheer size, the analysis of large coverage models can be an intimidating and time-consuming task. This paper presents two new techniques for coverage analysis. The first technique, coverage query, allows users that concentrate on a single uncovered event to find larger phenomena (e.g., hole) that contains this event. The second technique, quasi-hole analysis, automatically identifies large areas in the coverage space that are lightly covered. The proposed techniques provide additional means for extracting relevant, useful information, thereby improving the quality of the coverage analysis. A number of examples are provided showing how the proposed method improved the verification of actual designs.
Keywords
integrated circuit layout; integrated circuit testing; microprocessor chips; advanced analysis; coverage analysis; coverage query; coverage tools; cross-product coverage; quasi-hole analysis; verification process; Cost benefit analysis; Data analysis; Data mining; Information analysis; Investments; Laboratories; Monitoring; Process design; Risk analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
ISSN
1552-6674
Print_ISBN
0-7803-9571-9
Type
conf
DOI
10.1109/HLDVT.2005.1568842
Filename
1568842
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