DocumentCode
2912209
Title
A control-based approach to quantification of rate-dependent elastic modulus of living cell using atomic force microscope
Author
Juan Ren ; Shiyan Yu ; Nan Gao ; Qingze Zou
Author_Institution
Mech. & Aerosp. Eng. Dept., Rutgers Univ., Piscataway, NJ, USA
fYear
2013
fDate
17-19 June 2013
Firstpage
4730
Lastpage
4735
Abstract
This paper proposed a control-based approach to in-liquid nanoindentation measurement in mechanical property quantification of soft samples including living cell using atomic force microscope (AFM). Accurate indentation quantification is central to probe-based nanomechanical property measurement as the tip-cell interaction force and the indentation generated are the two most important variables to be measured. The conventional indentation measurement, however, fails to quantify the indentation accurately during the in-liquid nanomechanical measurement as the hydrodynamic force effect is not accounted for. We propose a control-based approach to accurately measure the indentation in liquid on soft sample even when the force load rate varies over a large range. The proposed approach is demonstrated through measuring the indentation and the elastic modulus of mouse embryonic fibroblast (MEF) cell in cell culture media when the force load rate was changed four orders of magnitude and up to hundred Hz range.
Keywords
atomic force microscopy; biomechanics; cellular biophysics; elastic moduli; hydrodynamics; nanoindentation; AFM; atomic force microscopy; cell culture media; control-based approach; conventional indentation measurement; force load rate; hydrodynamic force effect; in-liquid nanoindentation measurement; in-liquid nanomechanical measurement; indentation quantification; living cell; mechanical property quantification; mouse embryonic fibroblast cell; probe-based nanomechanical property; rate-dependent elastic modulus quantification; soft samples; tip-cell interaction force; Displacement measurement; Force; Force measurement; Hydrodynamics; Liquids; Nanobioscience; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2013
Conference_Location
Washington, DC
ISSN
0743-1619
Print_ISBN
978-1-4799-0177-7
Type
conf
DOI
10.1109/ACC.2013.6580569
Filename
6580569
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