• DocumentCode
    2912582
  • Title

    Time-frequency based pattern recognition technique for detection and classification of power quality disturbances

  • Author

    Chilukuri, M.V. ; Dash, P.K. ; Basu, K.P.

  • Author_Institution
    Multimedia Univ., Cyberjaya, Malaysia
  • Volume
    C
  • fYear
    2004
  • fDate
    21-24 Nov. 2004
  • Firstpage
    260
  • Abstract
    This paper proposes a simple time-frequency based pattern recognition technique for detection, classification and quantification of power quality disturbance waveforms. The proposed technique consists of time-frequency analysis, feature extraction, and pattern classification. Though there are several time-frequency analysis techniques exists in the literature, this paper uses S-transform to obtain the time-frequency characteristics of power quality events because of its superior performance under noise as well as harmonics. Using the time-frequency characteristics, a set of optimal features are extracted for pattern classification of power quality disturbances. Finally, a simple rule based system is developed for detection and classification of various power quality disturbances. Although the authors have proposed recently an S-transform based fuzzy expert system for power quality detection and classification, the proposed technique is simple and 98% accurate even under the presence of harmonics and high signal to noise ratio for the most of power quality disturbances.
  • Keywords
    expert systems; feature extraction; fuzzy systems; power engineering computing; power supply quality; power system faults; power system harmonics; time-frequency analysis; transforms; S-transform; feature extraction; fuzzy expert system; pattern classification; power quality detection; power quality disturbance; time-frequency analysis; time-frequency based pattern recognition technique; Feature extraction; Knowledge based systems; Pattern classification; Pattern recognition; Power quality; Power system harmonics; Power system reliability; Time frequency analysis; Voltage fluctuations; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2004. 2004 IEEE Region 10 Conference
  • Print_ISBN
    0-7803-8560-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2004.1414756
  • Filename
    1414756