DocumentCode
291341
Title
A new method for system diagnosis
Author
Xu, Shiyi ; Gao, Jianhua
Author_Institution
Shanghai Univ. of Sci. & Technol., China
fYear
1993
fDate
16-18 Nov 1993
Firstpage
147
Lastpage
152
Abstract
With the advent of parallel computing systems, the fault diagnosis of such systems becomes increasingly challenging and critical. In this paper, we first introduce the concept of binary decision diagram (BDD), based on which we present an efficient way to locate the faulty units according to what we call fault symptom (FS). The new technique is then proved to be optimal (shortest) in time-consuming. Finally, an intelligent searching procedure for fault diagnosis is given
Keywords
automatic testing; computational complexity; decision support systems; fault diagnosis; fault location; knowledge based systems; parallel algorithms; search problems; binary decision diagram; fault diagnosis; fault symptom; intelligent searching procedure; parallel computing; system diagnosis; Acceleration; Binary decision diagrams; Boolean functions; Data structures; Decision making; Equations; Fault diagnosis; Input variables; Parallel processing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location
Beijing
Print_ISBN
0-8186-3930-X
Type
conf
DOI
10.1109/ATS.1993.398794
Filename
398794
Link To Document