• DocumentCode
    2915563
  • Title

    Parameter Measurement through Network Based on Embedded System

  • Author

    Sannan, Yuan ; Shaoxu, Wang

  • Author_Institution
    Shanghai Univ. of Electr. Power, Shanghai, China
  • fYear
    2011
  • fDate
    19-20 Feb. 2011
  • Firstpage
    107
  • Lastpage
    110
  • Abstract
    This paper describes how to measure parameters including temperature, luminous flux, direct current and voltage and alternating current and voltage. It uses embedded system based on Samsung´s ARM920T processor S3C2410X and Linux Operating System. The system can measure the parameters of the time, store them in system memory, and send them to clients through network periodically according to internet network protocols. It can be set the range of these parameters and give alarms when go beyond the range. The hardware design of embedded system, linux operating system and driver development, realization of parameter measurement and application software are described.
  • Keywords
    Internet; Linux; computerised instrumentation; electric current measurement; microprocessor chips; photometry; protocols; reduced instruction set computing; temperature measurement; voltage measurement; Linux Operating System; RISC microprocessor; Samsung ARM920T processor S3C2410X; alternating current; application software; direct current measurement; embedded system; internet network protocol; luminous flux measurement; parameter measurement; system memory; temperature measurement; voltage measurement; Current measurement; Driver circuits; Hardware; Linux; Operating systems; Temperature measurement; Voltage measurement; Embedded System; Hardware; Parameter Measurement; Software Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Distributed Control and Intelligent Environmental Monitoring (CDCIEM), 2011 International Conference on
  • Conference_Location
    Changsha
  • Print_ISBN
    978-1-61284-278-3
  • Electronic_ISBN
    978-0-7695-4350-5
  • Type

    conf

  • DOI
    10.1109/CDCIEM.2011.463
  • Filename
    5747775