DocumentCode
2915923
Title
Double frequency test for detecting faults in induction machines
Author
Jornet, Atanasi ; Cusido, Jordi ; Espinos, Antoni García ; Ortega, Juan Antonio ; Romeral, Luis
Author_Institution
Dept. of Electr. Eng., Tech. Univ. of Catalonia, Spain
fYear
2005
fDate
6-10 Nov. 2005
Abstract
Double frequency tests are used for evaluating stator windings analyzing the temperature. Likewise, signal injection on induction machines is a well-known technique on sensorless motor control fields to find out the rotor´s position. Motor current signature analysis (MCSA) is the most widely used method for identifying faults in induction motors. MCSA focuses its efforts on the spectral analysis of stator current. Motor faults such as broken rotor bars, bearing damage and eccentricity of the rotor axis can be detected. However, the method presents some problems at low speed and low torque, mainly due to the proximity between the frequencies to be detected and the small amplitude of the resulting harmonics respectively. In both cases, the problem of frequency accuracy is very tricky since the sideband harmonic is close to the fundamental harmonic. This paper proposes injecting an additional voltage into the machine under test at a frequency different from the fundamental one, and then studying the resulting harmonics around the new frequencies appearing due to the composition between injected and main frequencies.
Keywords
bars; fault location; harmonics; induction motor drives; machine bearings; machine testing; rotors; spectral analysis; stators; bearing damage; broken rotor bar; double frequency test; eccentricity; electric drive; fault detection; induction machine; motor current signature analysis; sensorless motor control field; sideband harmonics; signal injection; spectral analysis; stator winding; Fault detection; Fault diagnosis; Frequency; Induction machines; Induction motors; Motor drives; Rotors; Stator windings; Temperature sensors; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Print_ISBN
0-7803-9252-3
Type
conf
DOI
10.1109/IECON.2005.1569129
Filename
1569129
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