• DocumentCode
    2916105
  • Title

    An investigation on ADC testing using digital modelling

  • Author

    Hon, Leong Mun ; A´ain, Abu Khari Bin

  • Author_Institution
    Electron. Eng. Dept., Univ. Teknologi Malaysia, Johor, Malaysia
  • Volume
    D
  • fYear
    2004
  • fDate
    21-24 Nov. 2004
  • Firstpage
    245
  • Abstract
    This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.
  • Keywords
    analogue-digital conversion; digital simulation; power supply circuits; voltage control; ADC; analogue-to-digital converter; arbitrary frequencies; digital modelling; fault coverage margin; histogram test; mixed mode test; periodical digital pulse; power supply voltage control test; pulse stimulus; unify circuit test; CMOS logic circuits; CMOS process; CMOS technology; Circuit faults; Circuit testing; Electronic equipment testing; Histograms; Pulsed power supplies; Semiconductor device modeling; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2004. 2004 IEEE Region 10 Conference
  • Print_ISBN
    0-7803-8560-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2004.1414915
  • Filename
    1414915