• DocumentCode
    2916703
  • Title

    The "G-F" 2-Valued Formula Generating Complete Set of Tests to Multiple Faults

  • Author

    Sheng, Yun Huan ; Li, Shao Qing

  • Author_Institution
    Changsha Inst. of Technology
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    343
  • Lastpage
    349
  • Keywords
    Circuit faults; Circuit testing; Computer science; Digital circuits; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit interconnections; Logic testing; Sociotechnical systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658081
  • Filename
    658081
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2916703