Evaluation of built-in sensors for RF LNA response measurement

This paper presents an evaluation of built-in test sensors for measuring the response of a Radio Frequency Low Noise Amplifier. These sensors provide low frequency or DC test measurements that can be used for low-cost on-chip or off-chip test. First, a variety of test measurements are evaluated by considering parametric test metrics (e.g. defect level and yield loss) and catastrophic fault coverage. Next, embedded sensors aimed at taking the selected measurements are presented. Finally, the test metrics of the overall chip are estimated at the schematic and the layout level.