• DocumentCode
    2917277
  • Title

    A New Strategy for Pairwise Test Case Generation

  • Author

    Cui, Yingxia ; Li, Longshu ; Yao, Sheng

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Anhui Univ., Hefei, China
  • Volume
    3
  • fYear
    2009
  • fDate
    21-22 Nov. 2009
  • Firstpage
    303
  • Lastpage
    306
  • Abstract
    Pairwise testing has become an important approach to software testing because it often provides effective error detection at low cost, and a key problem of it is the test case generation method. As the part of an effort to develop an optimized strategy for pairwise testing, this paper proposes an efficient pairwise test case generation strategy, called VIPO (Variant of In-Parameter-order), which is a variant of IPO strategy. We compare its effectiveness with some existing strategies including IPO, Tconfig, Pict and AllPairs. Experimental results demonstrate that VIPO outperformed them in terms of the number of generated test case within reasonable execution times, in most cases.
  • Keywords
    combinatorial mathematics; error detection; program testing; VIPO; combinatorial testing; effective error detection; pairwise test case generation; software testing; variant of in-parameter-order; Application software; Benchmark testing; Computer errors; Computer science; Costs; Information technology; Performance evaluation; Software quality; Software testing; System testing; horizontal growth; pairwise testing; test case generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application, 2009. IITA 2009. Third International Symposium on
  • Conference_Location
    Nanchang
  • Print_ISBN
    978-0-7695-3859-4
  • Type

    conf

  • DOI
    10.1109/IITA.2009.416
  • Filename
    5369430