DocumentCode
2917277
Title
A New Strategy for Pairwise Test Case Generation
Author
Cui, Yingxia ; Li, Longshu ; Yao, Sheng
Author_Institution
Dept. of Comput. Sci. & Technol., Anhui Univ., Hefei, China
Volume
3
fYear
2009
fDate
21-22 Nov. 2009
Firstpage
303
Lastpage
306
Abstract
Pairwise testing has become an important approach to software testing because it often provides effective error detection at low cost, and a key problem of it is the test case generation method. As the part of an effort to develop an optimized strategy for pairwise testing, this paper proposes an efficient pairwise test case generation strategy, called VIPO (Variant of In-Parameter-order), which is a variant of IPO strategy. We compare its effectiveness with some existing strategies including IPO, Tconfig, Pict and AllPairs. Experimental results demonstrate that VIPO outperformed them in terms of the number of generated test case within reasonable execution times, in most cases.
Keywords
combinatorial mathematics; error detection; program testing; VIPO; combinatorial testing; effective error detection; pairwise test case generation; software testing; variant of in-parameter-order; Application software; Benchmark testing; Computer errors; Computer science; Costs; Information technology; Performance evaluation; Software quality; Software testing; System testing; horizontal growth; pairwise testing; test case generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Information Technology Application, 2009. IITA 2009. Third International Symposium on
Conference_Location
Nanchang
Print_ISBN
978-0-7695-3859-4
Type
conf
DOI
10.1109/IITA.2009.416
Filename
5369430
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