DocumentCode
2918576
Title
Crystal orientation dependence of fatigue characteristics in single crystal silicon measured using a rotating micro resonator
Author
Ikehara, T. ; Tsuchiya, T.
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba
fYear
2008
fDate
13-17 Jan. 2008
Firstpage
435
Lastpage
438
Abstract
This paper reports the effect of crystal orientation on the fatigue fracture characteristics of single crystal silicon (SCS). Two types of micro resonators that have the same shapes were aligned to different directions: lang110rang and lang100rang. As a result, significant fatigue-life difference was observed. The lang100rang oriented test pieces showed almost 104 times longer fatigue life than the lang110rang oriented test pieces against same bending deflection. The difference is discussed through the fracture surface observation and stress analyses including both anisotropic elastic properties and anisotropic fracture strength.
Keywords
bending; crystal orientation; fatigue testing; fracture toughness testing; micromechanical resonators; silicon; stress analysis; Si; anisotropic elastic properties; anisotropic fracture strength; bending deflection; crystal orientation dependence; fatigue fracture characteristics; fracture surface observation; rotating micro resonator; single crystal silicon; stress analysis; Anisotropic magnetoresistance; Fatigue; Finite element methods; Life testing; Lithography; Micromechanical devices; Rotation measurement; Scattering; Silicon; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location
Tucson, AZ
ISSN
1084-6999
Print_ISBN
978-1-4244-1792-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2008.4443686
Filename
4443686
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