• DocumentCode
    2919266
  • Title

    Radiation characterization and test methodology study of optocouplers devices for space applications

  • Author

    Mangeret, R. ; Bonora, L. ; Bouchet, T. ; Peyre, D. ; Harboe-Sorensen, R.

  • Author_Institution
    Astrium, Toulouse, France
  • fYear
    2001
  • fDate
    10-14 Sept. 2001
  • Firstpage
    166
  • Lastpage
    171
  • Abstract
    This work investigates the degradation of several different optocouplers for space applications. Hardened and standard (unhardened) types are tested under proton, neutron and Co60 irradiations under various bias, fluence and dose rate conditions. An attempt to define an industrial cost-effective test procedure is proposed.
  • Keywords
    gamma-ray effects; neutron effects; opto-isolators; proton effects; radiation hardening (electronics); 60Co gamma irradiation; bias; dose rate; fluence; industrial cost-effective test procedure; neutron irradiation; optocouplers devices; proton irradiation; radiation characterization; space applications; test methodology; Degradation; Gallium arsenide; Light emitting diodes; Manufacturing; Neutrons; Photodiodes; Phototransistors; Protons; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
  • Print_ISBN
    0-7803-7313-8
  • Type

    conf

  • DOI
    10.1109/RADECS.2001.1159275
  • Filename
    1159275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2919266