DocumentCode
2919783
Title
Implications of advanced microelectronics technologies for heavy ion single event effect (SEE) testing
Author
Poivey, Christian ; Barth, Janet A. ; Reed, Robert ; Stassinopoulos, Epaminondas G. ; LaBel, Kenneth A. ; Xapsos, Michael
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
2001
fDate
10-14 Sept. 2001
Firstpage
328
Lastpage
331
Abstract
The complexity of SEE testing for space applications, has increased over the years. This trend has been mainly driven by advances in integrated circuit technologies. This paper reviews how the test environment relates to the real space environment. It shows that medium energy beams (25 to 200 MeV/amu) are more and more necessary for SEE testing of state-of-the-art microcircuits.
Keywords
ion beam effects; space vehicle electronics; SEE testing; advanced microelectronics technologies; heavy ion single event effect testing; medium energy ion beams; real space environment; space applications; state-of-the-art microcircuits; test environment; Circuit testing; Helium; Integrated circuit technology; Ionization; Materials testing; Microelectronics; NASA; Silicon; Space technology; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN
0-7803-7313-8
Type
conf
DOI
10.1109/RADECS.2001.1159302
Filename
1159302
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