• DocumentCode
    2920662
  • Title

    High-aspect-ratio vertical surface profiler using sensitive displacement detection by optomecanical probe

  • Author

    Hamaguchi, Y. ; Kubota, M. ; Pourciel, J.B. ; Mita, Y.

  • Author_Institution
    Univ. of Tokyo, Tokyo
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    884
  • Lastpage
    887
  • Abstract
    This paper proposes an optomechanical surface profiler for high aspect ratio vertical walls. The profiler consists of a bulk silicon micro cantilever probe with a vertical mirror at its end and an integrated sheath fiberguide to insert thinned optical fiber, all fabricated by deep reactive ion etching (DRIE). The probe reflects light by integrated vertical mirror and detects the surface contact point by measuring light power attenuation, which decreases according to the overdrive distance from the contact point. A new stair-shape vertical mirror showed a high (-7.3 dBm/mum) power-to-overdrive sensitivity at 3.5 mum overdriving displacement. Together with an original neck-pinched cantilever design, the proposed profiler showed a potential superiority to conventional piezoresistive detection method and applicability to narrower entrance high aspect ratio structures.
  • Keywords
    cantilevers; displacement measurement; micro-optomechanical devices; micromirrors; optical design techniques; optical fabrication; probes; silicon; sputter etching; surface topography measurement; Si; bulk silicon microcantilever probe; deep reactive ion etching; high-aspect-ratio vertical surface profiler; light power attenuation; neck-pinched cantilever design; optomechanical probe; power-to-overdrive sensitivity; sensitive displacement detection; stair-shape vertical mirror; surface contact point detection; Atom optics; High speed optical techniques; Mirrors; Optical detectors; Optical fibers; Optical sensors; Piezoresistance; Probes; Sensor phenomena and characterization; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443798
  • Filename
    4443798