• DocumentCode
    2921724
  • Title

    Fully Differential CMOS LNA and Down-Conversion Mixer for 3-5 GHz MB-OFDM UWB Receivers

  • Author

    Zhang, Hong ; Chen, Guican ; Yang, Xiao

  • Author_Institution
    Xian Jiaotong Univ., Xian
  • fYear
    2007
  • fDate
    9-11 Dec. 2007
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    This paper presents a fully differential low noise amplifier (LNA) and I/Q down-conversion mixers for 3-5 GHz multiband OFDM (MB-OFDM) UWB receivers. The LNA adopts capacitive cross-coupling common-gate (CG) topology to achieve wideband input matching and low noise figure (NF). Tuning technique is used in the double-balanced Gilbert mixer to realize flat conversion gain in the whole 3-5 GHz UWB band. Degeneration inductors are used in the mixer to improve linearity. Designed in 0.18 mum CMOS technology, the LNA achieves a NF of 3.2-3.5 dB and a S11 of less than -13 dB. The LNA and mixer show a total conversion gain of 23.5~25.5 dB, a NF of less than 5dB, an input IP3 of-4.3 dBm and an input IP2 of 47 dBm, while consuming only 10.1 mA from a 1.8 V power supply. The chip area is 1.38 x 0.95 mm2.
  • Keywords
    CMOS integrated circuits; OFDM modulation; amplification; low noise amplifiers; microwave mixers; microwave receivers; tuning; ultra wideband technology; CMOS LNA; CMOS technology; I/Q down-conversion mixers; MB-OFDM UWB receivers; capacitive cross-coupling common-gate topology; degeneration inductors; double-balanced Gilbert mixer; flat conversion gain; frequency 3 GHz to 5 GHz; low noise amplifier; multiband OFDM UWB receivers; noise figure; tuning technique; voltage 1.8 V; wideband input matching; Broadband amplifiers; CMOS technology; Character generation; Differential amplifiers; Impedance matching; Low-noise amplifiers; Noise measurement; OFDM; Topology; Wideband; Differential; LNA; MB-OFDM UWB; capacitive cross-coupling; common-gate; mixer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
  • Conference_Location
    Rasa Sentosa Resort
  • Print_ISBN
    978-1-4244-1307-2
  • Electronic_ISBN
    978-1-4244-1308-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2007.4443918
  • Filename
    4443918