• DocumentCode
    2922947
  • Title

    Characterization of the error resiliency of power grid substation devices

  • Author

    Tseng, Kuan-Yu ; Chen, Daniel ; Kalbarczyk, Zbigniew ; Iyer, Ravishankar K.

  • Author_Institution
    Center for Reliable & High-Performance Comput., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2012
  • fDate
    25-28 June 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.
  • Keywords
    critical infrastructures; fault diagnosis; integrated circuit reliability; microprocessor chips; power grids; substations; control center; control critical infrastructures; electric power grids; error resiliency characterization; gas distribution; microprocessor-based devices; microprocessor-based system reliability; oil distribution; power grid substation devices; software-implemented fault injection technique; transient errors; Monitoring; Power grids; Registers; Relays; Servers; Substations; Transient analysis; fault injection; power grid; reliability; security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2012 42nd Annual IEEE/IFIP International Conference on
  • Conference_Location
    Boston, MA
  • ISSN
    1530-0889
  • Print_ISBN
    978-1-4673-1624-8
  • Electronic_ISBN
    1530-0889
  • Type

    conf

  • DOI
    10.1109/DSN.2012.6263924
  • Filename
    6263924