DocumentCode
2924258
Title
Test results of the readout electronics for nuclear applications (RENA) chip
Author
Visser, Gerard I. ; Kravis, Scott D. ; Tumer, T.O. ; Maeding, Dale G. ; Yin, Shi
Author_Institution
NOVA R&D Inc., Riverside, CA, USA
Volume
1
fYear
1998
fDate
1998
Firstpage
249
Abstract
A mixed signal Application Specific Integrated Circuit (ASIC) chip for front end readout electronics of position sensitive solid state detectors has been developed. The new ASIC is called RENA (Readout Electronics for Nuclear Applications). This chip can be used for large number of channels and high energy resolution astrophysics and nuclear physics detectors, and medical imaging instruments such as solid state gamma camera, Compton SPECT and Intraoperative probes. It can also be used for industrial imaging of X-rays and gamma rays used in nondestructive evaluation (NDE) and inspection (NDI). The RENA chip is a monolithic integrated circuit and has 32 channels with low noise charge sensitive amplifiers followed by a polarity amplifier and a high quality shaper circuit. It works in pulse counting mode with good energy resolution. It also has a self-triggering output which is essential for nuclear applications when the incident radiation arrives at random. Different, externally selectable, operational modes that include a sparse readout mode are available to increase data throughput. It also has externally selectable shaping (peaking) times. A full scale prototype RENA chip has been manufactured. The preliminary results of tests done on the prototype chip are presented
Keywords
mixed analogue-digital integrated circuits; nuclear electronics; pulse shaping circuits; readout electronics; ASIC chip; Compton SPECT; Intraoperative probes; RENA chip; externally selectable shaping times; front end readout electronics; high energy resolution astrophysics; high quality shaper circuit; low noise charge sensitive amplifiers; medical imaging instruments; mixed signal application specific integrated circuit chip; monolithic integrated circuit; nondestructive evaluation; nuclear physics detectors; polarity amplifier; position sensitive solid state detectors; pulse counting mode; readout electronics for nuclear applications chip; self-triggering output; solid state gamma camera; sparse readout mode; Application specific integrated circuits; Circuit testing; Electronic equipment testing; Energy resolution; Low-noise amplifiers; Medical signal detection; Prototypes; Pulse amplifiers; Readout electronics; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location
Toronto, Ont.
ISSN
1082-3654
Print_ISBN
0-7803-5021-9
Type
conf
DOI
10.1109/NSSMIC.1998.775139
Filename
775139
Link To Document