• DocumentCode
    2925799
  • Title

    P4-17: Recent advances on electrical contact resistance: Theory and experiment

  • Author

    Zhang, Peng ; Gomez, Matthew R. ; French, David M. ; Tang, Wilkin ; Lau, Yue Ying ; Gilgenbach, Ronald M.

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    479
  • Lastpage
    480
  • Abstract
    This paper discusses recent advances on the electrical contact resistance. The basic theory of the contact resistance is vastly extended to higher dimensions, including dissimilar materials in the main current channels and in the connecting bridge joining them. Recent experiments and simulations were also performed to validate our theory.
  • Keywords
    contact resistance; electrical contacts; dissimilar materials; electrical contact resistance; Bridge circuits; Circuit simulation; Conducting materials; Contact resistance; Electric resistance; Joining materials; Joining processes; Rough surfaces; Surface resistance; Surface roughness; Contact resistance; dissimilar materials; higher dimensions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503466
  • Filename
    5503466
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2925799