• DocumentCode
    2926383
  • Title

    P2-28: Modeling of beam generation in IOT electron guns

  • Author

    Jackson, Robert H. ; Bui, Thuc ; Read, Michael ; Ives, Lawrence

  • Author_Institution
    Calabazas Creek Res., Inc., San Mateo, CA, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    277
  • Lastpage
    278
  • Abstract
    The computational capabilities needed for practical IOT/MBIOT design will be discussed. These were evaluated using a combination of analysis and test simulations employing static and fully electromagnetic codes. The presentation will focus on the most difficult aspect: simulation of beam formation in the cathode-grid region. It will be shown that electron transit delay in the cathode-grid gap causes inherent asymmetries in beam properties: pulse shape, secondary emission, etc. Acceleration across the anode - cathode gap exacerbates these differences because the pulse head and tail experience dissimilar space charge effects. Thus IOT beam formation is fundamentally time dependent (i.e. non-harmonic) and requires, at minimum, electrostatic particle-in-cell techniques for accurate simulation.
  • Keywords
    anodes; cathodes; electron guns; microwave tubes; IOT electron guns; IOT/MBIOT design; anode-cathode gap; beam generation; cathode-grid region; electromagnetic codes; electron transit delay; electrostatic particle-in-cell technique; inductive output tubes; space charge effect; Analytical models; Computational modeling; Delay; Electromagnetic analysis; Electron beams; Electron emission; Electron guns; Pulse shaping methods; Shape; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503496
  • Filename
    5503496