• DocumentCode
    2927708
  • Title

    P1–20: A comparison of model thin film scandate cathode surfaces

  • Author

    Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.

  • Author_Institution
    Dept. of Phys. & Astron., Ohio Univ., Athens, OH, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    Thin film model cathodes prepared as 200nm nominally thick sputter deposited coatings in many configurations of Sc, Sc2O3, Ba, BaO on W foil (0.05mm thick) were studied using photoelectron emission microcopy (PEEM) and thermionic emission microscopy (ThEEM) in a BauerTelieps style LEEM/PEEM.
  • Keywords
    barium compounds; cathodes; photoelectron microscopy; scandium compounds; sputtered coatings; thermionic emission; thin film devices; tungsten; BaO; BauerTelieps style LEEM/PEEM; Sc2O3; ThEEM; W; W foil; photoelectron emission microcopy; size 0.05 mm; size 200 nm; thermionic emission microscopy; thick sputter deposited coatings; thin film scandate cathode surfaces; Atomic layer deposition; Barium; Brightness temperature; Cathodes; Current density; Current measurement; Density measurement; Photoelectron microscopy; Temperature measurement; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503563
  • Filename
    5503563
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2927708