• DocumentCode
    2929224
  • Title

    Electrochemical and thermochemical memories

  • Author

    Waser, Rainer

  • Author_Institution
    Julich-Aachen Res. Alliance, Sect. Fundamentals of Future Inf. Technol. (JARA-FIT), Forschungszentrum Julich, Julich
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The review provides a survey of non-volatile, highly scalable memory devices which are based on electrochemical and thermochemical phenomena controlling the resistance of nanoscale memory cells. The classification of the memory effects, the understanding of the underlying mechanisms, and a sketch of the integration efforts will be presented.
  • Keywords
    random-access storage; electrochemical memories; nanoscale memory cells; thermochemical memories; Bridge circuits; Conductors; Electric resistance; Electrodes; Insulation; Metal-insulator structures; Morphology; Nonvolatile memory; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2008. IEDM 2008. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    8164-2284
  • Print_ISBN
    978-1-4244-2377-4
  • Electronic_ISBN
    8164-2284
  • Type

    conf

  • DOI
    10.1109/IEDM.2008.4796675
  • Filename
    4796675
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2929224