• DocumentCode
    2929595
  • Title

    Application of multivariate empirical mode decomposition for seizure detection in EEG signals

  • Author

    Rehman, Naveed Ur ; Xia, Yili ; Mandic, Danilo P.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    1650
  • Lastpage
    1653
  • Abstract
    We present a method for the analysis of electroencephalogram (EEG) signals which has the potential to distinguish between ictal and seizure-free intracranial EEG recordings. This is achieved by analyzing common frequency components in multichannel EEG recordings, using the multivariate empirical mode decomposition (MEMD) algorithm. The mean frequency of the signal is calculated by applying the Hilbert-Huang transform on the resulting intrinsic mode functions (IMFs). It has been shown that the mean frequency estimates for the ictal and seizure-free EEG recordings are statistically different, and hence, can serve as a test statistic to distinguish between the two classes of signals. Simulation results on real world EEG signals support the analysis and demonstrate the potential of the proposed scheme.
  • Keywords
    diseases; electroencephalography; medical signal detection; medical signal processing; transforms; EEG signals; Hilbert-Huang transform; electroencephalogram; ictal EEG; intrinsic mode functions; multivariate empirical mode decomposition; seizure detection; seizure-free intracranial EEG; Brain; Electroencephalography; Epilepsy; Feature extraction; Frequency estimation; Time frequency analysis; Transforms; Algorithms; Data Interpretation, Statistical; Diagnosis, Computer-Assisted; Electroencephalography; Humans; Multivariate Analysis; Pattern Recognition, Automated; Reproducibility of Results; Seizures; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5626665
  • Filename
    5626665