• DocumentCode
    2930671
  • Title

    Side channel modeling attacks on 65nm arbiter PUFs exploiting CMOS device noise

  • Author

    Delvaux, Jeroen ; Verbauwhede, Ingrid

  • Author_Institution
    ESAT/SCD-COSIC & iMinds, KU Leuven, Heverlee, Belgium
  • fYear
    2013
  • fDate
    2-3 June 2013
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    Physically Unclonable Functions (PUFs) are emerging as hardware security primitives. For so-called strong PUFs, the number of challenge-response pairs (CRPs) increases exponentially with the required chip area in the ideal case. They can provide a mechanism to authenticate chips which is inherently unique for every manufactured sample. Modeling of the CRP behavior through Machine Learning (ML) has shown to be a threat however. In this paper, we exploit repeatability imperfections of PUF responses as a side channel for model building. We demonstrate that 65nm CMOS arbiter PUFs can be modeled successfully, without utilizing any ML algorithm. Data originates from real-world measurements and hence not from simulations. Modeling accuracies exceeding 97% are obtained, which is comparable with previously published ML results. Information leakage through the exploited side channel should be considered for all strong PUF designs. Combined attack strategies, whereby repeatability measurements facilitate ML, might be effective and are recommended for further research.
  • Keywords
    CMOS integrated circuits; electronic engineering computing; learning (artificial intelligence); CMOS device noise; CRP behavior; ML algorithm; arbiter PUF; challenge-response pair; hardware security primitive; machine learning; physically unclonable function; repeatability measurements; side channel modeling; size 65 nm; Accuracy; CMOS integrated circuits; Least squares approximations; Noise; Security; Semiconductor device modeling; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4799-0559-1
  • Type

    conf

  • DOI
    10.1109/HST.2013.6581579
  • Filename
    6581579