• DocumentCode
    2930903
  • Title

    0.25 mu m PHEMT X-band multifunction LNA MMIC with T/R switch and attenuator achieves 1.85 dB noise figure

  • Author

    Janesch, S.T. ; Duh, K.H.G. ; Ho, P. ; Wang, S.C. ; Liu, S.M.J.

  • Author_Institution
    General Electric Co., Syracuse, NY, USA
  • fYear
    1992
  • fDate
    1-5 June 1992
  • Firstpage
    1179
  • Abstract
    The performance of a 7-11-GHz LNA (low-noise amplifier) MIC (monolithic microwave integrated circuit) which advances performance and integration standards is presented. A 1.8-dB noise figure (NF), 19-dB-gain LNA is coupled with a 0.5-dB insertion loss T/R (transmit/receive) switch and switched attenuator for a MMIC with 1.85-dB NF, 18-dB gain at 10 GHz. The X-band multifunction LNA MMIC was fabricated on the GE 0.25- mu m pseudomorphic high-electron-mobility transistor (PHEMT) process. The noise figure for the MMIC is below 2.2 dB (minimum 1.85 dB), the gain is above 20 dB, and the input return loss is better than 13 dB from 7 GHz to 11 GHz. The T/R switch and 8-dB attenuator function as designed. This excellent performance can be attributed to careful measurement, accurate modeling of a large number of devices, thorough design, and careful, repeatable fabrication.<>
  • Keywords
    MMIC; attenuators; field effect integrated circuits; high electron mobility transistors; microwave amplifiers; semiconductor switches; 0.25 micron; 0.5 dB; 1.8 to 2.2 dB; 13 dB; 18 to 20 dB; 7 to 11 GHz; MMIC; PHEMT; SHF; T/R switch; X-band multifunction LNA; high-electron-mobility transistor; low-noise amplifier; monolithic microwave integrated circuit; pseudomorphic HEMT process; switched attenuator; transmit/receive switch; Attenuators; Coupling circuits; Low-noise amplifiers; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Noise figure; Noise measurement; PHEMTs; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1992., IEEE MTT-S International
  • Conference_Location
    Albuquerque, NM, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-0611-2
  • Type

    conf

  • DOI
    10.1109/MWSYM.1992.188207
  • Filename
    188207