DocumentCode
2931349
Title
Ultra-low phase noise frequency synthesis chains for high-performance vapor cell atomic clocks
Author
Francois, B. ; Boudot, R. ; Calosso, C.E. ; Danet, J.M.
Author_Institution
Univ. de Franche-Comte, Besancon, France
fYear
2015
fDate
12-16 April 2015
Firstpage
81
Lastpage
83
Abstract
This paper presents the development of a 9.192 GHz microwave frequency synthesis chain (absolute and residual noise characterization) dedicated to be a local oscillator (LO) in a high-performance cesium vapor cell atomic clock based on coherent population trapping (CPT). The key components are an ultra low noise oven controlled quartz crystal oscillator (OCXO), multiplied to 9.2 GHz using a non-linear transmission line. A dielectric resonator oscillator (DRO) is phase-locked onto the microwave signal to generate the 9.192 GHz frequency. The absolute phase noise of the LO has been characterized at the level of -42, -100, -117 dBrad2/Hz and -129 dBrad2/Hz at 1 Hz, 100 Hz, 1 kHz and 10 kHz offset frequencies respectively. With such performances, the expected Dick effect contribution to the atomic clock short term frequency stability is reported to 6.2×10-14 at 1 s integration time. Main limitations are pointed out.
Keywords
atomic clocks; caesium; crystal oscillators; frequency stability; frequency synthesizers; high-frequency transmission lines; microwave frequency convertors; phase noise; Cs; Dick effect contribution; coherent population trapping; frequency 9.192 GHz; high-performance vapor cell atomic clocks; local oscillator; microwave frequency synthesis chain; microwave signal; nonlinear transmission line; phase-locked dielectric resonator oscillator; ultra low noise oven controlled quartz crystal oscillator; ultra-low phase noise frequency synthesis chains; Atomic clocks; Frequency synthesizers; Microwave oscillators; Phase noise; Power system stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location
Denver, CO
Print_ISBN
978-1-4799-8865-5
Type
conf
DOI
10.1109/FCS.2015.7138796
Filename
7138796
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