DocumentCode
2931546
Title
Predicting temporal lobe epileptic seizures based on zero-crossing interval analysis in scalp EEG
Author
Zandi, Ali Shahidi ; Tafreshi, Reza ; Javidan, Manouchehr ; Dumont, Guy A.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
5537
Lastpage
5540
Abstract
A novel real-time patient-specific algorithm to predict epileptic seizures is proposed. The method is based on the analysis of the positive zero-crossing intervals in the scalp electroencephalogram (EEG), describing the brain dynamics. In a moving-window analysis, the histogram of these intervals in each EEG epoch is computed, and the distribution of the histogram value in specific bins, selected using interictal and preictal references, is estimated based on the values obtained from the current epoch and the epochs of the last 5 min. The resulting distribution for each selected bin is then compared to two reference distributions (interictal and preictal), and a seizure prediction index is developed. Comparing this index with a patient-specific threshold for all EEG channels, a seizure prediction alarm is finally generated. The algorithm was tested on ~15.5 hours of multichannel scalp EEG recordings from three patients with temporal lobe epilepsy, including 14 seizures. 86% of seizures were predicted with an average prediction time of 20.8 min and a false prediction rate of 0.12/hr.
Keywords
electroencephalography; medical disorders; medical signal processing; neurophysiology; brain dynamics; moving-window analysis; scalp EEG; scalp electroencephalogram; seizure prediction index; temporal lobe epileptic seizures; zero-crossing interval analysis; Electroencephalography; Epilepsy; Histograms; Prediction algorithms; Scalp; Sensitivity; Temporal lobe; Algorithms; Electroencephalography; Epilepsy, Temporal Lobe; Humans; Scalp; Seizures;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5626764
Filename
5626764
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