• DocumentCode
    2932612
  • Title

    Epoxy-additive interaction studies of thermally reworkable underfills for flip-chip applications

  • Author

    Wang, Lejun ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    34
  • Lastpage
    42
  • Abstract
    Reworkable underfill encapsulant is the key to address the non-reworkability of the flip-chip-on-board packages. This paper presents work on epoxy-additive interaction studying to develop reworkable additive-modified underfills. Four additives that have the potential to provide epoxy reworkability are selected. Their interactions with epoxy composition before, during, and after epoxy curing are studied. The results show that all additives retain their thermal decomposition feature after they are incorporated into the epoxy formulation, and they do not adversely affect the epoxy properties. However, when the additive decomposition temperature is reached, the decomposition of the additive caused a big CTE jump in the epoxy matrix. Additionally, the adhesion of the epoxy matrix is greatly reduced. These two changes are considered important to provide reworkability to the epoxy. Based on the epoxy-additive interaction study, two additives are selected for developing reworkable additive-modified epoxy underfills
  • Keywords
    adhesion; encapsulation; filled polymers; flip-chip devices; microassembling; packaging; FCOB assemblies; additive decomposition temperature; epoxy curing; epoxy matrix adhesion; epoxy-additive interaction studies; flip-chip applications; flip-chip-on-board packages; thermally reworkable underfills; underfill encapsulant; Additives; Adhesives; Chemicals; Curing; Electronic packaging thermal management; Fatigue; Materials science and technology; Matrix decomposition; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776061
  • Filename
    776061