• DocumentCode
    2932740
  • Title

    Polymer thick film materials for integral resistors

  • Author

    Xiao, Allison Y. ; Tong, Quinn K. ; Savoca, Ann C.

  • Author_Institution
    Nat. Starch & Chem. Co., Bridgewater, NJ, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    88
  • Lastpage
    92
  • Abstract
    Trends in the electronics industry, requiring products to be smaller, lighter, and cheaper, are driving the development of integral passive technology. New design system, test system, and manufacturing processes provide new challenges and the opportunity to employ new passive materials. In general, metal/ceramic based materials provide better resistance stability, however, high processing temperatures, (up to 800°C), make them unusable with organic substrates. In contrast, polymeric materials (e.g. polymer thick films or PTFs), provide a wide range of resistivity with reasonable curing temperatures. However, unstable electrical resistance, especially under high temperature and humidity conditions over a long period of time, is a major hurdle. A structure-property-performance study was conducted on a series of commercially available polymer thick film (PTF) materials. The objective was to identify the fundamental failure mechanisms contributing to unstable electrical resistivity. For the materials studied, interfacial failure was the dominant mechanism and the resistance drift was found to be irreversible. These results suggested that corrosion of the metal substrate at the metal-PTF interface caused the increase in resistance. Based on this finding, a series of new PTF materials have been developed with improved resistance stability. Resistance drift, ((R-Ro)/Ro), has been reduced from 800% for the commercial materials to 15% for the novel PTF materials
  • Keywords
    electrical resistivity; polymer films; thick film resistors; curing process; electrical resistivity; integral resistor; interfacial failure; metal substrate corrosion; organic substrate; passive component; polymer thick film material; resistance drift; resistance stability; Conducting materials; Electric resistance; Electronics industry; Materials testing; Polymer films; Resistors; Stability; Substrates; Temperature; Thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776069
  • Filename
    776069