• DocumentCode
    2933884
  • Title

    On the guaranteed failing and working frequencies in path delay fault analysis

  • Author

    Peng, Qiang ; Agrawal, Vishwani D. ; Savir, Jacob

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1794
  • Abstract
    When running a set of test vectors to detect path delay faults in a digital system, desired test frequencies are needed. In this paper we determine the guaranteed failure frequency (GFF) and the guaranteed working frequency (GWF) for a given set of test vectors used for path delay testing of a sequential circuit. If the circuit passes the test when the vectors are applied at GFF, then all paths activated by those vectors are guaranteed to be free from delay faults provided the clock frequency does not exceed the GWF. Ambiguity cancellation and minmax-delay or statistical-delay modeling techniques are used in a timing simulation system to determine GFF and GWF. Experiments show that by using the guaranteed failure frequency, we can obtain the best (most reliable) path delay fault coverage provided by the given test vectors
  • Keywords
    automatic test pattern generation; design for testability; fault simulation; logic testing; minimax techniques; sequential circuits; timing; ambiguity cancellation; deterministic vectors; digital system; guaranteed failure frequency; guaranteed working frequency; minmax-delay modeling; nearly optimal delay fault coverage; path delay fault analysis; selective hazard suppression; sequential circuit; set of test vectors; statistical-delay modeling; timing simulation system; Circuit faults; Circuit testing; Delay; Digital systems; Electrical fault detection; Fault detection; Frequency; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776130
  • Filename
    776130