• DocumentCode
    2934931
  • Title

    Pb-free solder alloys for flip chip applications

  • Author

    Kang, S.K. ; Horkans, J. ; Andricacos, P.C. ; Carruthers, R.A. ; Cotte, J. ; Datta, M. ; Gruber, P. ; Harper, J.M.E. ; Kwietniak, K. ; Sambucetti, C. ; Shi, L. ; Brouillette, G. ; Danovitch, D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    283
  • Lastpage
    288
  • Abstract
    In addition to the environmental issue regarding the use of Pb-bearing solders in microelectronics applications, there is another issue associated with using Pb-bearing solders in interconnections, like flip chip solder interconnections in an advanced CMOS technology, that are near active circuits. In order to minimize the soft error rate due to alpha particle emission from Pb-bearing solder alloys, Pb-free solder alloys were studied as possible replacements for the Pb-based solders that are presently used in flip chip interconnections. A large number of solder compositions was selected for evaluation. Since all the candidate alloys were Sn-based, alternatives for the ball-limiting metallurgy (BLM) were also investigated. The physical, chemical, mechanical and electrical properties of the alloys were determined by thermal analysis, wettability testing, microhardness measurement, electrical resistivity measurement, interfacial reaction study and others. Test vehicles were also built with some selected Pb-free solder alloys with the proper BLM to evaluate integrity of the flip chip solder bump structure. Based on this study, a few candidate solder alloys were selected with a proper BLM barrier layer for flip chip applications
  • Keywords
    electrical resistivity; flip-chip devices; hardness testing; integrated circuit interconnections; materials testing; mechanical properties; melting; microassembling; microhardness; soldering; thermal analysis; tin alloys; wetting; BLM barrier layer; Pb-bearing solder alloys; Pb-free solder alloys; Sn-based alloys; advanced CMOS technology; alpha particle emission; ball-limiting metallurgy; chemical properties; electrical properties; electrical resistivity measurement; flip chip applications; flip chip solder interconnections; interfacial reaction study; mechanical properties; microelectronics; microhardness measurement; physical properties; soft error rate; solder bump structure; solder compositions; thermal analysis; wettability testing; Active circuits; CMOS technology; Chemical analysis; Electric variables measurement; Flip chip; Integrated circuit interconnections; Mechanical variables measurement; Microelectronics; Semiconductor device measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776186
  • Filename
    776186