DocumentCode
2935319
Title
Etalon Effects Analysis in Tunable Diode Laser Absorption Spectroscopy Gas Concentration Detection System Based on Wavelength Modulation Spectroscopy
Author
Cao, Jia-Nian ; Wang, Zhuo ; Zhang, Ke-Ke ; Yang, Rui ; Wang, Yong
Author_Institution
Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
5
Abstract
Tunable diode laser absorption spectroscopy (TDLAS) is a technique measuring the concentration of trace-gas, the gas concentration is in the sub-ppm (part-per-million) range. Experiment results show that the main part of system noise is interference fringes originating from multiple reflections between surfaces in optical components, so-called etalon effects. This work investigates the basis principle of the measurement of trace-gas concentration using wavelength modulation spectroscopy (WMS) technique and analyses etalon effects from different types of optical surfaces. Fluctuations in temperature or vibrations of the etalon cause the interference fringes to shift in wavelength, and the interference fringes originated from short etalons within laser or photodetector cannot be removed by subtraction of a zero baseline using wedged or dithered components. It is shown that although analytical signal, SAS,nf, for short etalons, is decreasing with increased detection order, the signal-to-background ratio (SAS/SBG)nf is improved significantly. It is more advantageous to detect higher even harmonic signals, e.g. the 4th or 6th, than 2nd to reduce or eliminate the interference fringes originated from short etalons within laser or photodetector.
Keywords
light interference; modulation spectroscopy; photodetectors; semiconductor lasers; WMS technique; etalon effects analysis; gas concentration detection system; interference fringes; optical components; photodetectors; signal-to-background ratio; tunable diode laser absorption spectroscopy; wavelength modulation spectroscopy; Absorption; Diode lasers; Interference; Optical noise; Optical reflection; Optical surface waves; Photodetectors; Spectroscopy; Tunable circuits and devices; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504036
Filename
5504036
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