DocumentCode
2936211
Title
A multilayer magnetic force microscopy tip and comparison of its imaging performance with conventional tips
Author
Han, G. ; Wu, Y. ; Zheng, Y.
Author_Institution
Data Storage Inst., Singapore
fYear
2006
fDate
8-12 May 2006
Firstpage
178
Lastpage
178
Abstract
We present the fabrication and testing of a multilayer coated tip, in which a central thicker ferromagnetic (FM) layer is antiferromagnetically (AFM) coupled with two thinner FM layers at both sides via an ultrathin Ru layer. The performance of the tip is tested by imaging magnetic patterns recorded on longitudinal media. The improvement on spatial resolution and sensitivity is confirmed by comparing the imaging performance with that of conventional tips.
Keywords
antiferromagnetic materials; ferromagnetic materials; magnetic force microscopy; magnetic multilayers; ruthenium; antiferromagnetic layer; ferromagnetic layer; magnetic patterns imaging; multilayer magnetic force microscopy tip; ultrathin layer; Antiferromagnetic materials; Atomic force microscopy; Coatings; Magnetic force microscopy; Magnetic forces; Magnetic multilayers; Memory; Nanostructures; Spatial resolution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.375678
Filename
4261612
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