• DocumentCode
    2937550
  • Title

    Performance of V-BLAST in impulsive noise

  • Author

    Abuhilal, Hasan ; Hocanin, Aykut ; Bilgekul, Huseyin

  • Author_Institution
    Elektrik ve Elektron. Muhendisligi Bolumu, Dogu Akdeniz Univ., Gazimagosa
  • fYear
    2008
  • fDate
    20-22 April 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The performance analysis of the zero-forcing successive interference cancellation (ZF-SIC) detector in vertical Bell labs layered space-time (V-BLAST) is generally considered under additive white Gaussian noise (AWGN) channel. However, a large class of physical phenomenon observed in wireless systems exhibit non-Gaussian behavior. In this paper we present the performance of the (V-BLAST) detection algorithm under impulsive noise channel characterized by Middletonpsilas class A model with binary phase shift keying (BPSK) modulation in the richly scattered Rayleigh-fading multiple-antenna channel. The performance is described by the mean of bit error rate (BER) of the system. We discuss the performance under different antenna configurations and different noise parameters.
  • Keywords
    AWGN channels; Rayleigh channels; error statistics; impulse noise; interference suppression; multifrequency antennas; phase shift keying; radiocommunication; signal detection; AWGN channel; BER; BPSK modulation; Middleton class A model; Rayleigh-fading multiple-antenna channel; V-BLAST; additive white Gaussian noise channel; antenna configurations; binary phase shift keying; bit error rate; impulsive noise; impulsive noise channel; noise parameters; nonGaussian behavior; vertical Bell labs layered space-time; wireless systems; zero-forcing successive interference cancellation detector; AWGN; Additive white noise; Binary phase shift keying; Bit error rate; Detection algorithms; Detectors; Gaussian noise; Interference cancellation; Noise cancellation; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing, Communication and Applications Conference, 2008. SIU 2008. IEEE 16th
  • Conference_Location
    Aydin
  • Print_ISBN
    978-1-4244-1998-2
  • Electronic_ISBN
    978-1-4244-1999-9
  • Type

    conf

  • DOI
    10.1109/SIU.2008.4632664
  • Filename
    4632664