• DocumentCode
    293863
  • Title

    Scintillation detectors based on poly-2,4-dimethylstyrene: structural peculiarities and radiation damage

  • Author

    Gunder, Olga A. ; Voronkina, Nina I. ; Kopina, Inna V.

  • Author_Institution
    Inst. of Single Crystals, Acad. of Sci., Kharkov, Ukraine
  • Volume
    1
  • fYear
    1994
  • fDate
    30 Oct-5 Nov 1994
  • Firstpage
    126
  • Abstract
    Scintillation detectors based on poly-2,4-dimethyl styrene (P-2,4-DMS) are studied. Investigated is the influence of two methyl groups present in the benzene ring on the energy, spectral and structural characteristics of the polymer. The said factors are assumed to result in the detectors high light output and radiation resistance. It is shown that under radiolysis (77 K) the radiation yield of the paramagnetic centers of P-2,4-DMS exceeds that of polystyrene (PST) by ~1.5 times. Unlike PST film, the luminescence spectra of P-2,4-DMS are characterized by the presence of both excimer (320-340 nm) and monomer (292 nm) bands. Revealed are the distinctions in the nature of the optical characteristics of macroradicals and the efficiency of energy transfer in gamma-irradiated PST and P-2,4-DMS scintillators. The relation between the supermolecular structure of the polymers and the interaction of their macroradicals with molecular O2 is stated
  • Keywords
    polymer structure; radiation effects; radiolysis; solid scintillation detectors; macroradicals; methyl groups; optical characteristics; paramagnetic centers; poly-2,4-dimethylstyrene; radiation damage; radiation resistance; radiation yield; radiolysis; scintillation detectors; structural peculiarities; supermolecular structure; Ionization; Luminescence; Optical scattering; Paramagnetic materials; Polymer films; Radiation detectors; Scintillation counters; Solid scintillation detectors; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
  • Conference_Location
    Norfolk, VA
  • Print_ISBN
    0-7803-2544-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1994.474376
  • Filename
    474376