DocumentCode
2940226
Title
Moving dipoles method detects displacement in N2 and P3 generation in diffuse axonal injury patients
Author
Molteni, Erika ; Gatti, Eleonora ; Bianchi, Anna M. ; Cerutti, Sergio
Author_Institution
Dipt. di Bioingegneria, Politec. di Milano, Milan, Italy
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
3265
Lastpage
3268
Abstract
Physiological neural mechanisms underlying attentional processes were investigated by means of moving dipoles method in survivors of diffuse axonal injury (DAI) and in a control group. N2 and P3 components were obtained by means of the administration of the Conner´s Continuous Performance Test. Analysis of behavioral responses showed significant between-group differences in reaction times and error rates. A different number of dipoles was needed for the reconstruction of both N2 and P3 components in the two groups. The study of dipoles location revealed major displacements in damaged brains with respect to physiology. In conclusion, data from DAI patients showed that neuronal reorganization following brain injury evolves towards the generation of multiple central sources.
Keywords
electroencephalography; injuries; medical signal processing; neurophysiology; signal reconstruction; Conner´s continuous performance test; EEG; N2 generation; P3 generation; attentional processes; damaged brains; diffuse axonal injury patients; error rates; moving dipoles method; multiple central sources generation; neuronal reorganization; physiological neural mechanisms; reaction times; signal reconstruction; Band pass filters; Brain injuries; Electric potential; Electroencephalography; Generators; Visualization; Algorithms; Brain; Brain Mapping; Computer Simulation; Diagnosis, Computer-Assisted; Diffuse Axonal Injury; Electroencephalography; Evoked Potentials, Visual; Humans; Models, Neurological; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5627223
Filename
5627223
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